Latest Generation Wafer-Level 1/f Noise Measurement System Improves Upon Industry's de facto Standard
SAN JOSE, CA--(Marketwired - Jan 15, 2014) - More than 10 units of 9812D™ Noise Analyzer, the latest generation wafer-level 1/f noise measurement system from ProPlus Design Solutions, Inc., have been shipped to leading foundries and integrated device manufacturers (IDMs) since it was introduced early last year.
ProPlus, the global leader for SPICE modeling solutions and the leading technology provider for Design-for-Yield (DFY) applications, announced limited availability of 9812D in January 2013. Since then, it's been adopted worldwide for low-frequency noise characterization and process quality monitoring at advanced nodes such as 28 nanometer (nm) bulk CMOS, 16- and 14nm FinFET and beyond.
"While we believed 9812D would become the new standard, we are pleased by its rapid adoption," affirms Dr. Zhihong Liu, executive chairman of ProPlus Design Solutions. "The rapid adoption and strong interest, confirms that noise is an increasingly critical consideration for semiconductor process quality at advanced nodes. It also confirms that we built the right product for the emerging needs of the industry. Our customers have proven 9812D can increase their measurement throughput significantly with increased accuracy and frequency bandwidth."
9812D improves upon 9812B, the industry's de facto standard 1/f measurement system used for more than a decade, through a series of greatly improved low-noise amplifiers (LNAs), and a built-in dynamic signal analyzer (DSA) with multi-threaded processing to offer improved performance and reduced cost.
While other systems exhibit roll-off at higher frequencies, 9812D can accurately measure noise data up to 10 Megahertz (MHz) for on wafer measurement setup. It has the highest throughput for noise measurement, critical for full wafer auto noise measurement, statistical noise characterization or 24x7 process quality monitoring by foundries. 9812D uses a patent-protected multiple LNA architecture to deliver high accuracy for both low- and high-impedance devices under test (DUTs). Another advantage is its noise characterization capabilities at high voltage or low current conditions.